Detecting and Measuring Defects in Wafer Die Using GAN and YOLOv3
This research used deep learning methods to develop a set of algorithms to detect die particle defects.Generative adversarial network (GAN) generated natural and realistic images, which improved Canvas Mesh Athletic Running Shoes the ability of you only look once version 3 (YOLOv3) to detect die defects.Then defects were measured based on the bound